Products
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Introduction to STEMx/4D STEM (Self-Paced)
CourseIntroduces participants to the 4D STEM diffraction technique, plus the necessary infrastructure that is required to perform these studies, including detectors and software.
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STEMx/4D STEM: Data Processing and Analysis (Self-Paced)
CourseThis course reviews the processing and analysis of 4D STEM data using DigitalMicrograph built-in tools, including virtual aperture imaging, strain mapping, and differential phase contrast (DPC) analysis.
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STEMx/4D STEM: Data Acquisition (Self-Paced)
CourseThis course focuses on how to acquire 4D STEM data and covers information from setting up the various required detectors for a 4D STEM experiment to more advanced experiments like in-situ 4D STEM.
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Practical Aspects in EELS mode (Self Paced)
CourseThe training delves into the crucial aspect of measuring collection angles using DigitalMicrograph, emphasizing their impact on acquired spectra. A three-part course: Scattering angle, dispersion and aperture choice, and detector settings.
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DualEELS Quantification (Self Paced)
CourseThis course focuses on acquiring low and high-loss spectra in a DualEELS pair for precise energy-loss measurements, correcting plural scattering, and absolute quantification.
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EELS Fundamentals (Self-Paced)
CourseUnderstanding the EELS fundamentals process and procedures foundation.